A new AFM method to characterize the piezoelectric properties of nanostructures

  • October 7, 2011

  • October 7, 2011

R. Hinchet, X. Xu, J.W. Lee, B. Bercu, A. Potie, T. Baron, B. Salem, R. Songmuang, G. Ardila, M. Mouis and L. Montes, “A new AFM method to characterize the piezoelectric properties of nanostructures“, 4th GDR Nanowires Meeting, October 7-21 2011, Porquerolles, France,(Poster presentation).

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